Micro-cracking in polycrystalline Silicon is a serious concern for the durability of photovoltaic (PV) modules due to the resulting electrical power-loss. In this contribution, a thermo-mechanical cohesive zone model is proposed to predict the evolution of micro-cracks under the action of mechanical and thermal loads. The classical nonlinear cohesive zone approach, used in fracture mechanics to depict the phenomenon of cracking as a result of progressive breakage of atomic bonds, is extended to thermo-elastic fields. The additional thermal resistance of micro-cracks due to imperfect bonding is estimated according to an analogy with a contact mechanics formulation, where the dependency on the crack opening is suitably accounted for. A numerical example shows the applicability of the proposed approach to practical problems.
Numerical modelling of microcracking in PV modules induced by thermo-mechanical loads / Paggi, M; Sapora, A. - In: ENERGY PROCEDIA. - ISSN 1876-6102. - 38:(2013), pp. 506-515. ( 3rd International Conference on Crystalline Silicon Photovoltaics, SiliconPV 2013 Hamelin; Germany 25-27 March 2013) [10.1016/j.egypro.2013.07.310].
Numerical modelling of microcracking in PV modules induced by thermo-mechanical loads
Paggi M;
2013
Abstract
Micro-cracking in polycrystalline Silicon is a serious concern for the durability of photovoltaic (PV) modules due to the resulting electrical power-loss. In this contribution, a thermo-mechanical cohesive zone model is proposed to predict the evolution of micro-cracks under the action of mechanical and thermal loads. The classical nonlinear cohesive zone approach, used in fracture mechanics to depict the phenomenon of cracking as a result of progressive breakage of atomic bonds, is extended to thermo-elastic fields. The additional thermal resistance of micro-cracks due to imperfect bonding is estimated according to an analogy with a contact mechanics formulation, where the dependency on the crack opening is suitably accounted for. A numerical example shows the applicability of the proposed approach to practical problems.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

