Infrared (IR), under forward bias and under illuminated condition, and electroluminescence (EL) are the most employed non-destructive techniques to monitor performance of photovoltaics (PV) modules. The application of these two techniques have advantages and drawbacks and a combined use has not been made extensively. With this purpose, we performed a quantitative comparison of EL and IR images of monocrystalline PV modules after 20 years of outdoor exposure and use. The proposed methodology relies in the analysis of frequency histograms of IR and EL images. Results provides local information on PV modules state, useful to distinguish disconnected cell interconnect, humidity corrosion, and broken fingers in highly damaged solar cells. This method contributes and supports to the current knowledge of IR and EL imaging techniques used to assess different forms of damage in monocrystalline silicon PV modules. Moreover, it could contribute to the future draft technical specification IEC 60904-13 for EL.

Analysis of electroluminescence and infrared thermal images of monocrystalline silicon photovoltaic modules after 20 years of outdoor use in a solar vehicle

Paggi, M.
Investigation
;
2018-01-01

Abstract

Infrared (IR), under forward bias and under illuminated condition, and electroluminescence (EL) are the most employed non-destructive techniques to monitor performance of photovoltaics (PV) modules. The application of these two techniques have advantages and drawbacks and a combined use has not been made extensively. With this purpose, we performed a quantitative comparison of EL and IR images of monocrystalline PV modules after 20 years of outdoor exposure and use. The proposed methodology relies in the analysis of frequency histograms of IR and EL images. Results provides local information on PV modules state, useful to distinguish disconnected cell interconnect, humidity corrosion, and broken fingers in highly damaged solar cells. This method contributes and supports to the current knowledge of IR and EL imaging techniques used to assess different forms of damage in monocrystalline silicon PV modules. Moreover, it could contribute to the future draft technical specification IEC 60904-13 for EL.
2018
Crystalline silicon photovoltaics; Electroluminescence; Image analysis; Outdoor ageing; Solar vehicle; Thermal infrared imaging; Renewable Energy, Sustainability and the Environment; Materials Science (all)
File in questo prodotto:
File Dimensione Formato  
Pre-print.pdf

accesso aperto

Descrizione: Preprint
Tipologia: Documento in Pre-print
Licenza: Creative commons
Dimensione 9.81 MB
Formato Adobe PDF
9.81 MB Adobe PDF Visualizza/Apri
1-s2.0-S0038092X18307199-main.pdf

non disponibili

Tipologia: Versione Editoriale (PDF)
Licenza: Nessuna licenza
Dimensione 3.02 MB
Formato Adobe PDF
3.02 MB Adobe PDF   Visualizza/Apri   Richiedi una copia

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.11771/10677
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 49
social impact